Structure and thermal stability of amorphous Co23Fe60B17 film on Si substrate

Structure and thermal stability of amorphous Co23Fe60B17 film on Si substrate

Structural evolution with thermal annealing of the thin film of amorphous Co23Fe60B17 depositors on Si/SiO2 substrate has been studied using grazing incidence x-ray diffraction, soft x-ray absorption spectroscopy (SXAS), and secondary ion mass spectrometry (SIMS). Amorphous to crystalline transforma...

Full description

Bibliographic Details
Main Authors: Jagrati Dwivedi, Mukul Gupta, V.R. Reddy, Ashutosh Mishra, Ajay Gupta
Format: Article
Language:English
Published: Elsevier 2021-09-01
Series:Applied Surface Science Advances
Subjects:
Amorphous/crystalline CoFeB
Absorption spectroscopy
x-ray diffraction
Online Access:http://www.sciencedirect.com/science/article/pii/S2666523921000593

Similar Items

Similar Items