A high sensitive photonic crystal Mach-Zehnder-Interferometer based pressure-sensor

PC-MZI based pressure-sensor is modelled and analyzed in this work. Analysis of the pressure sensor is carried out in two phases. The FEM is used for the stress analysis of the diaphragm. The FDTD-method is carried out for analyzing the electromagnetic field characteristics of MZI resonator. This de...

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Main Authors: Venkateswara Rao Kolli, Basavaprasad, Indira Bahaddur, Srinivas Talabattula
Format: Article
Language:English
Published: Elsevier 2021-12-01
Series:Results in Optics
Subjects:
FEM
Online Access:http://www.sciencedirect.com/science/article/pii/S2666950121000663
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spelling doaj-0d7ecde9b2074d47895df00b1d29461c2021-07-31T04:41:19ZengElsevierResults in Optics2666-95012021-12-015100118A high sensitive photonic crystal Mach-Zehnder-Interferometer based pressure-sensorVenkateswara Rao Kolli0 Basavaprasad1Indira Bahaddur2Srinivas Talabattula3Electronics and Communication Engineering, Malnad College of Engineering, Hassan 573 202, India; Corresponding author.Electronics and Communication Engineering, Malnad College of Engineering, Hassan 573 202, IndiaElectronics and Communication Engineering, Malnad College of Engineering, Hassan 573 202, IndiaElectrical Communication Engineering, Indian Institute of Science, Bangalore 560 012, IndiaPC-MZI based pressure-sensor is modelled and analyzed in this work. Analysis of the pressure sensor is carried out in two phases. The FEM is used for the stress analysis of the diaphragm. The FDTD-method is carried out for analyzing the electromagnetic field characteristics of MZI resonator. This device works with the principle that when the light propagates in two of its arms, light undergoes a phase difference if one of its arms has differed in optical length from the other. The time taken by the light propagating along the longer arm is larger than that of the shorter arm. The surface average stress is estimated for the applied pressure using the FEM method. The wavelength-shift is observed for the applied pressure at the output port of the PC MZI. The wavelength resolution of 2.25 nm per 1 MPa applied pressure and the Q-factor of 7100 is obtained. The minimum pressure that can be detected by the sensor is about 873 µPa.http://www.sciencedirect.com/science/article/pii/S2666950121000663Mach Zehnder InterferometerPressure-sensorPhoto elastic-effectFEMFDTD methodHigh Q factor
collection DOAJ
language English
format Article
sources DOAJ
author Venkateswara Rao Kolli
Basavaprasad
Indira Bahaddur
Srinivas Talabattula
spellingShingle Venkateswara Rao Kolli
Basavaprasad
Indira Bahaddur
Srinivas Talabattula
A high sensitive photonic crystal Mach-Zehnder-Interferometer based pressure-sensor
Results in Optics
Mach Zehnder Interferometer
Pressure-sensor
Photo elastic-effect
FEM
FDTD method
High Q factor
author_facet Venkateswara Rao Kolli
Basavaprasad
Indira Bahaddur
Srinivas Talabattula
author_sort Venkateswara Rao Kolli
title A high sensitive photonic crystal Mach-Zehnder-Interferometer based pressure-sensor
title_short A high sensitive photonic crystal Mach-Zehnder-Interferometer based pressure-sensor
title_full A high sensitive photonic crystal Mach-Zehnder-Interferometer based pressure-sensor
title_fullStr A high sensitive photonic crystal Mach-Zehnder-Interferometer based pressure-sensor
title_full_unstemmed A high sensitive photonic crystal Mach-Zehnder-Interferometer based pressure-sensor
title_sort high sensitive photonic crystal mach-zehnder-interferometer based pressure-sensor
publisher Elsevier
series Results in Optics
issn 2666-9501
publishDate 2021-12-01
description PC-MZI based pressure-sensor is modelled and analyzed in this work. Analysis of the pressure sensor is carried out in two phases. The FEM is used for the stress analysis of the diaphragm. The FDTD-method is carried out for analyzing the electromagnetic field characteristics of MZI resonator. This device works with the principle that when the light propagates in two of its arms, light undergoes a phase difference if one of its arms has differed in optical length from the other. The time taken by the light propagating along the longer arm is larger than that of the shorter arm. The surface average stress is estimated for the applied pressure using the FEM method. The wavelength-shift is observed for the applied pressure at the output port of the PC MZI. The wavelength resolution of 2.25 nm per 1 MPa applied pressure and the Q-factor of 7100 is obtained. The minimum pressure that can be detected by the sensor is about 873 µPa.
topic Mach Zehnder Interferometer
Pressure-sensor
Photo elastic-effect
FEM
FDTD method
High Q factor
url http://www.sciencedirect.com/science/article/pii/S2666950121000663
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