Disorder effects in nitride semiconductors: impact on fundamental and device properties

Semiconductor structures used for fundamental or device applications most often incorporate alloy materials. In “usual” or “common” III–V alloys, based on the InGaAsP or InGaAlAs material systems, the effects of compositional disorder on the electronic properties can be treated in a perturbative app...

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Main Authors: Weisbuch Claude, Nakamura Shuji, Wu Yuh-Renn, Speck James S.
Format: Article
Language:English
Published: De Gruyter 2020-11-01
Series:Nanophotonics
Subjects:
Online Access:https://doi.org/10.1515/nanoph-2020-0590
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spelling doaj-0d52d1dff95247658c3618051bdd36c72021-09-06T19:20:37ZengDe GruyterNanophotonics2192-86062192-86142020-11-0110132110.1515/nanoph-2020-0590Disorder effects in nitride semiconductors: impact on fundamental and device propertiesWeisbuch Claude0Nakamura Shuji1Wu Yuh-Renn2Speck James S.3Materials Department, University of California, Santa Barbara, California93106-5050, USAMaterials Department, University of California, Santa Barbara, California93106-5050, USAGraduate Institute of Photonics and Optoelectronics and Department of Electrical Engineering, National Taiwan University, Taipei10617, TaiwanMaterials Department, University of California, Santa Barbara, California93106-5050, USASemiconductor structures used for fundamental or device applications most often incorporate alloy materials. In “usual” or “common” III–V alloys, based on the InGaAsP or InGaAlAs material systems, the effects of compositional disorder on the electronic properties can be treated in a perturbative approach. This is not the case in the more recent nitride-based GaInAlN alloys, where the potential changes associated with the various atoms induce strong localization effects, which cannot be described perturbatively. Since the early studies of these materials and devices, disorder effects have indeed been identified to play a major role in their properties. Although many studies have been performed on the structural characterization of materials, on intrinsic electronic localization properties, and on the impact of disorder on device operation, there are still many open questions on all these topics. Taking disorder into account also leads to unmanageable problems in simulations. As a prerequisite to address material and device simulations, a critical examination of experiments must be considered to ensure that one measures intrinsic parameters as these materials are difficult to grow with low defect densities. A specific property of nitride semiconductors that can obscure intrinsic properties is the strong spontaneous and piezoelectric fields. We outline in this review the remaining challenges faced when attempting to fully describe nitride-based material systems, taking the examples of LEDs. The objectives of a better understanding of disorder phenomena are to explain the hidden phenomena often forcing one to use ad hoc parameters, or additional poorly defined concepts, to make simulations agree with experiments. Finally, we describe a novel simulation tool based on a mathematical breakthrough to solve the Schrödinger equation in disordered potentials that facilitates 3D simulations that include alloy disorder.https://doi.org/10.1515/nanoph-2020-0590iii–v alloysalloy materialsfundamental and device propertiesledsnitride semiconductors
collection DOAJ
language English
format Article
sources DOAJ
author Weisbuch Claude
Nakamura Shuji
Wu Yuh-Renn
Speck James S.
spellingShingle Weisbuch Claude
Nakamura Shuji
Wu Yuh-Renn
Speck James S.
Disorder effects in nitride semiconductors: impact on fundamental and device properties
Nanophotonics
iii–v alloys
alloy materials
fundamental and device properties
leds
nitride semiconductors
author_facet Weisbuch Claude
Nakamura Shuji
Wu Yuh-Renn
Speck James S.
author_sort Weisbuch Claude
title Disorder effects in nitride semiconductors: impact on fundamental and device properties
title_short Disorder effects in nitride semiconductors: impact on fundamental and device properties
title_full Disorder effects in nitride semiconductors: impact on fundamental and device properties
title_fullStr Disorder effects in nitride semiconductors: impact on fundamental and device properties
title_full_unstemmed Disorder effects in nitride semiconductors: impact on fundamental and device properties
title_sort disorder effects in nitride semiconductors: impact on fundamental and device properties
publisher De Gruyter
series Nanophotonics
issn 2192-8606
2192-8614
publishDate 2020-11-01
description Semiconductor structures used for fundamental or device applications most often incorporate alloy materials. In “usual” or “common” III–V alloys, based on the InGaAsP or InGaAlAs material systems, the effects of compositional disorder on the electronic properties can be treated in a perturbative approach. This is not the case in the more recent nitride-based GaInAlN alloys, where the potential changes associated with the various atoms induce strong localization effects, which cannot be described perturbatively. Since the early studies of these materials and devices, disorder effects have indeed been identified to play a major role in their properties. Although many studies have been performed on the structural characterization of materials, on intrinsic electronic localization properties, and on the impact of disorder on device operation, there are still many open questions on all these topics. Taking disorder into account also leads to unmanageable problems in simulations. As a prerequisite to address material and device simulations, a critical examination of experiments must be considered to ensure that one measures intrinsic parameters as these materials are difficult to grow with low defect densities. A specific property of nitride semiconductors that can obscure intrinsic properties is the strong spontaneous and piezoelectric fields. We outline in this review the remaining challenges faced when attempting to fully describe nitride-based material systems, taking the examples of LEDs. The objectives of a better understanding of disorder phenomena are to explain the hidden phenomena often forcing one to use ad hoc parameters, or additional poorly defined concepts, to make simulations agree with experiments. Finally, we describe a novel simulation tool based on a mathematical breakthrough to solve the Schrödinger equation in disordered potentials that facilitates 3D simulations that include alloy disorder.
topic iii–v alloys
alloy materials
fundamental and device properties
leds
nitride semiconductors
url https://doi.org/10.1515/nanoph-2020-0590
work_keys_str_mv AT weisbuchclaude disordereffectsinnitridesemiconductorsimpactonfundamentalanddeviceproperties
AT nakamurashuji disordereffectsinnitridesemiconductorsimpactonfundamentalanddeviceproperties
AT wuyuhrenn disordereffectsinnitridesemiconductorsimpactonfundamentalanddeviceproperties
AT speckjamess disordereffectsinnitridesemiconductorsimpactonfundamentalanddeviceproperties
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