Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head
A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest compone...
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| Language: | English |
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MDPI AG
2021-01-01
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| Series: | Sensors |
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| Online Access: | https://www.mdpi.com/1424-8220/21/2/362 |
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doaj-0cda37eee6da43f489e43399cf4506602021-01-08T00:02:16ZengMDPI AGSensors1424-82202021-01-012136236210.3390/s21020362Design and Fabrication of a High-Speed Atomic Force Microscope Scan-HeadLuke Oduor Otieno0Bernard Ouma Alunda1Jaehyun Kim2Yong Joong Lee3Department of Mechanical Engineering, Kyungpook National University, Daegu 41566, KoreaSchool of Mines and Engineering, Taita Taveta University, P.O. Box 635, Voi 80300, KenyaDepartment of Mechanical and Design Engineering, Hongik University, Sejong 30016, KoreaDepartment of Mechanical Engineering, Kyungpook National University, Daegu 41566, KoreaA high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest component determines the overall bandwidth of the instrument. In this work, we present a design of a compact HS-AFM scan-head featuring minimal loading on the Z-scanner. Using a custom-programmed controller and a high-speed lateral scanner, we demonstrate its working by obtaining topographic images of Blu-ray disk data tracks in contact- and tapping-modes. Images acquired using a contact-mode cantilever with a natural frequency of 60 kHz in constant deflection mode show good tracking of topography at 400 Hz. In constant height mode, tracking of topography is demonstrated at rates up to 1.9 kHz for the scan size of <inline-formula><math display="inline"><semantics><mrow><mn>1</mn><mspace width="0.166667em"></mspace><mi mathvariant="sans-serif">μ</mi><mi mathvariant="normal">m</mi><mo>×</mo><mn>1</mn><mspace width="0.166667em"></mspace><mi mathvariant="sans-serif">μ</mi><mi mathvariant="normal">m</mi></mrow></semantics></math></inline-formula> with <inline-formula><math display="inline"><semantics><mrow><mn>100</mn><mo>×</mo><mn>100</mn></mrow></semantics></math></inline-formula> pixels.https://www.mdpi.com/1424-8220/21/2/362atomic force microscopyhigh-speed atomic force microscopehigh-speed atomic force microscope scan-head |
| collection |
DOAJ |
| language |
English |
| format |
Article |
| sources |
DOAJ |
| author |
Luke Oduor Otieno Bernard Ouma Alunda Jaehyun Kim Yong Joong Lee |
| spellingShingle |
Luke Oduor Otieno Bernard Ouma Alunda Jaehyun Kim Yong Joong Lee Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head Sensors atomic force microscopy high-speed atomic force microscope high-speed atomic force microscope scan-head |
| author_facet |
Luke Oduor Otieno Bernard Ouma Alunda Jaehyun Kim Yong Joong Lee |
| author_sort |
Luke Oduor Otieno |
| title |
Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head |
| title_short |
Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head |
| title_full |
Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head |
| title_fullStr |
Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head |
| title_full_unstemmed |
Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head |
| title_sort |
design and fabrication of a high-speed atomic force microscope scan-head |
| publisher |
MDPI AG |
| series |
Sensors |
| issn |
1424-8220 |
| publishDate |
2021-01-01 |
| description |
A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest component determines the overall bandwidth of the instrument. In this work, we present a design of a compact HS-AFM scan-head featuring minimal loading on the Z-scanner. Using a custom-programmed controller and a high-speed lateral scanner, we demonstrate its working by obtaining topographic images of Blu-ray disk data tracks in contact- and tapping-modes. Images acquired using a contact-mode cantilever with a natural frequency of 60 kHz in constant deflection mode show good tracking of topography at 400 Hz. In constant height mode, tracking of topography is demonstrated at rates up to 1.9 kHz for the scan size of <inline-formula><math display="inline"><semantics><mrow><mn>1</mn><mspace width="0.166667em"></mspace><mi mathvariant="sans-serif">μ</mi><mi mathvariant="normal">m</mi><mo>×</mo><mn>1</mn><mspace width="0.166667em"></mspace><mi mathvariant="sans-serif">μ</mi><mi mathvariant="normal">m</mi></mrow></semantics></math></inline-formula> with <inline-formula><math display="inline"><semantics><mrow><mn>100</mn><mo>×</mo><mn>100</mn></mrow></semantics></math></inline-formula> pixels. |
| topic |
atomic force microscopy high-speed atomic force microscope high-speed atomic force microscope scan-head |
| url |
https://www.mdpi.com/1424-8220/21/2/362 |
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