An Integrated Detection Circuit for Transmission Coefficients
As the applications of radio-frequency (RF) circuits continue to prosper, scattering parameters (S-parameters) play an essential role in the verification of a variety of chips. The traditional way to measure the S-parameters of RF integrated circuits (RFICs) is by using vector network analyzers (VNA...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/8941034/ |