Determination of the compositions of the DIGM zone in nanocrystalline Ag/Au and Ag/Pd thin films by secondary neutral mass spectrometry

Determination of the compositions of the DIGM zone in nanocrystalline Ag/Au and Ag/Pd thin films by secondary neutral mass spectrometry

Alloying by grain boundary diffusion-induced grain boundary migration is investigated by secondary neutral mass spectrometry depth profiling in Ag/Au and Ag/Pd nanocrystalline thin film systems. It is shown that the compositions in zones left behind the moving boundaries can be determined by this te...

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Bibliographic Details
Main Authors: Gábor Y. Molnár, Shenouda S. Shenouda, Gábor L. Katona, Gábor A. Langer, Dezső L. Beke
Format: Article
Language:English
Published: Beilstein-Institut 2016-03-01
Series:Beilstein Journal of Nanotechnology
Subjects:
diffusion-induced grain boundary migration
grain boundary diffusion
nanocrystalline films
Online Access:https://doi.org/10.3762/bjnano.7.41

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