Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy

The depth distribution of secondary phases in the solar cell absorber material Cu2ZnSnS4 (CZTS) is quantitatively investigated using X-ray Absorption Near Edge Structure (XANES) analysis at the K-edge of sulfur at varying incidence angles. Varying information depths from several nanometers up to the...

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Main Authors: J. Just, D. Lützenkirchen-Hecht, O. Müller, R. Frahm, T. Unold
Format: Article
Language:English
Published: AIP Publishing LLC 2017-12-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/1.5000306
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spelling doaj-0a799aacb53d407bb4ae25754f7c063f2020-11-24T20:59:43ZengAIP Publishing LLCAPL Materials2166-532X2017-12-01512126106126106-710.1063/1.5000306003711APMDepth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopyJ. Just0D. Lützenkirchen-Hecht1O. Müller2R. Frahm3T. Unold4Department Structure and Dynamics of Energy Materials, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin, GermanyFakultät 4–Physik, Bergische Universität Wuppertal, Gaussstrasse 20, 42109 Wuppertal, GermanyStanford Synchrotron Radiation Lightsource (SSRL), SLAC National Accelerator Laboratory, Stanford University, Menlo Park, California 94025, USAFakultät 4–Physik, Bergische Universität Wuppertal, Gaussstrasse 20, 42109 Wuppertal, GermanyDepartment Structure and Dynamics of Energy Materials, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Hahn-Meitner-Platz 1, 14109 Berlin, GermanyThe depth distribution of secondary phases in the solar cell absorber material Cu2ZnSnS4 (CZTS) is quantitatively investigated using X-ray Absorption Near Edge Structure (XANES) analysis at the K-edge of sulfur at varying incidence angles. Varying information depths from several nanometers up to the full thickness is achieved. A quantitative profile of the phase distribution is obtained by a self-consistent fit of a multilayer model to the XANES spectra for different angles. Single step co-evaporated CZTS thin-films are found to exhibit zinc and copper sulfide secondary phases preferentially at the front or back interfaces of the film.http://dx.doi.org/10.1063/1.5000306
collection DOAJ
language English
format Article
sources DOAJ
author J. Just
D. Lützenkirchen-Hecht
O. Müller
R. Frahm
T. Unold
spellingShingle J. Just
D. Lützenkirchen-Hecht
O. Müller
R. Frahm
T. Unold
Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy
APL Materials
author_facet J. Just
D. Lützenkirchen-Hecht
O. Müller
R. Frahm
T. Unold
author_sort J. Just
title Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy
title_short Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy
title_full Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy
title_fullStr Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy
title_full_unstemmed Depth distribution of secondary phases in kesterite Cu2ZnSnS4 by angle-resolved X-ray absorption spectroscopy
title_sort depth distribution of secondary phases in kesterite cu2znsns4 by angle-resolved x-ray absorption spectroscopy
publisher AIP Publishing LLC
series APL Materials
issn 2166-532X
publishDate 2017-12-01
description The depth distribution of secondary phases in the solar cell absorber material Cu2ZnSnS4 (CZTS) is quantitatively investigated using X-ray Absorption Near Edge Structure (XANES) analysis at the K-edge of sulfur at varying incidence angles. Varying information depths from several nanometers up to the full thickness is achieved. A quantitative profile of the phase distribution is obtained by a self-consistent fit of a multilayer model to the XANES spectra for different angles. Single step co-evaporated CZTS thin-films are found to exhibit zinc and copper sulfide secondary phases preferentially at the front or back interfaces of the film.
url http://dx.doi.org/10.1063/1.5000306
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AT rfrahm depthdistributionofsecondaryphasesinkesteritecu2znsns4byangleresolvedxrayabsorptionspectroscopy
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