Controlled growth and magnetic property of a-plane-oriented Mn3Sn thin films

Highly a-plane-oriented Mn3Sn thin films were grown on m-plane sapphire substrates with low-temperature grown Mn3+xSn buffer layers by sputtering deposition technique, and their crystallinity and magnetic properties were investigated by X-ray diffraction and SQUID magnetometer, respectively. The cry...

Full description

Bibliographic Details
Main Authors: Seungjun Oh, Tadashi Morita, Tomoki Ikeda, Masakiyo Tsunoda, Mikihiko Oogane, Yasuo Ando
Format: Article
Language:English
Published: AIP Publishing LLC 2019-03-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.5079688
Description
Summary:Highly a-plane-oriented Mn3Sn thin films were grown on m-plane sapphire substrates with low-temperature grown Mn3+xSn buffer layers by sputtering deposition technique, and their crystallinity and magnetic properties were investigated by X-ray diffraction and SQUID magnetometer, respectively. The crystallographic orientations of Mn3Sn domains are found to be sensitively influenced by substrate temperature, thickness and composition ratio of Mn3+αSn buffer layer. The highly a-plane-oriented Mn3Sn film shows slightly different magnetization behavior from randomly oriented Mn3Sn film, while the saturation magnetization Ms and coercivity of the highly a-plane-oriented Mn3Sn film are corresponding to that of single crystal bulk.
ISSN:2158-3226