Characterization and fine mapping of a new dwarf mutant in Brassica napus

Characterization and fine mapping of a new dwarf mutant in Brassica napus

Abstract Background Plant height is an important plant characteristic closely related to yield performance of many crops. Reasonable reduction of plant height of crops is beneficial for improving yield and enhancing lodging resistance. Results In the present study, we described the Brassica napus dw...

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Bibliographic Details
Main Authors: Xin Li, Fujiang Xiang, Wei Zhang, Jindong Yan, Xinmei Li, Ming Zhong, Piao Yang, Caiyan Chen, Xuanming Liu, Donghai Mao, Xiaoying Zhao
Format: Article
Language:English
Published: BMC 2021-02-01
Series:BMC Plant Biology
Subjects:
Brassica napus
Dwarf
Grain yield
BSA
Fine mapping
Online Access:https://doi.org/10.1186/s12870-021-02885-y

Internet

https://doi.org/10.1186/s12870-021-02885-y

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