Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films

Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films

Spatial variability of conductivity in ceria is explored using scanning probe microscopy with galvanostatic control. Ionically blocking electrodes are used to probe the conductivity under opposite polarities to reveal possible differences in the defect structure across a thin film of Ce...

Full description

Bibliographic Details
Main Authors: Tim Farrow, Nan Yang, Sandra Doria, Alex Belianinov, Stephen Jesse, Thomas M. Arruda, Giuseppe Balestrino, Sergei V. Kalinin, Amit Kumar
Format: Article
Language:English
Published: AIP Publishing LLC 2015-03-01
Series:APL Materials
Online Access:http://dx.doi.org/10.1063/1.4914943
id doaj-08220fe60e1d408382549e0df77756ae
record_format Article
spelling doaj-08220fe60e1d408382549e0df77756ae2020-11-25T01:45:02ZengAIP Publishing LLCAPL Materials2166-532X2015-03-0133036106036106-710.1063/1.4914943005503APMSub-nA spatially resolved conductivity profiling of surface and interface defects in ceria filmsTim Farrow0Nan Yang1Sandra Doria2Alex Belianinov3Stephen Jesse4Thomas M. Arruda5Giuseppe Balestrino6Sergei V. Kalinin7Amit Kumar8Centre for Nanostructured Media, School of Mathematics and Physics, Queen’s University Belfast, Belfast BT7 1NN, United KingdomCNR-SPIN and Engineering Faculty, Università degli studi Niccolò Cusano, Rome I-00166, ItalyCNR-SPIN and DICCI Dipartiment, Università di Roma Tor Vergata, Via del Politecnico 1, I-00133 Rome, ItalyCenter for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USACenter for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USAChemistry Department, Salve Regina University, Newport, Rhode Island 02840, USACNR-SPIN and DICCI Dipartiment, Università di Roma Tor Vergata, Via del Politecnico 1, I-00133 Rome, ItalyCenter for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USACentre for Nanostructured Media, School of Mathematics and Physics, Queen’s University Belfast, Belfast BT7 1NN, United Kingdom Spatial variability of conductivity in ceria is explored using scanning probe microscopy with galvanostatic control. Ionically blocking electrodes are used to probe the conductivity under opposite polarities to reveal possible differences in the defect structure across a thin film of CeO2. Data suggest the existence of a large spatial inhomogeneity that could give rise to constant phase elements during standard electrochemical characterization, potentially affecting the overall conductivity of films on the macroscale. The approach discussed here can also be utilized for other mixed ionic electronic conductor systems including memristors and electroresistors, as well as physical systems such as ferroelectric tunneling barriers. http://dx.doi.org/10.1063/1.4914943
collection DOAJ
language English
format Article
sources DOAJ
author Tim Farrow
Nan Yang
Sandra Doria
Alex Belianinov
Stephen Jesse
Thomas M. Arruda
Giuseppe Balestrino
Sergei V. Kalinin
Amit Kumar
spellingShingle Tim Farrow
Nan Yang
Sandra Doria
Alex Belianinov
Stephen Jesse
Thomas M. Arruda
Giuseppe Balestrino
Sergei V. Kalinin
Amit Kumar
Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films
APL Materials
author_facet Tim Farrow
Nan Yang
Sandra Doria
Alex Belianinov
Stephen Jesse
Thomas M. Arruda
Giuseppe Balestrino
Sergei V. Kalinin
Amit Kumar
author_sort Tim Farrow
title Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films
title_short Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films
title_full Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films
title_fullStr Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films
title_full_unstemmed Sub-nA spatially resolved conductivity profiling of surface and interface defects in ceria films
title_sort sub-na spatially resolved conductivity profiling of surface and interface defects in ceria films
publisher AIP Publishing LLC
series APL Materials
issn 2166-532X
publishDate 2015-03-01
description Spatial variability of conductivity in ceria is explored using scanning probe microscopy with galvanostatic control. Ionically blocking electrodes are used to probe the conductivity under opposite polarities to reveal possible differences in the defect structure across a thin film of CeO2. Data suggest the existence of a large spatial inhomogeneity that could give rise to constant phase elements during standard electrochemical characterization, potentially affecting the overall conductivity of films on the macroscale. The approach discussed here can also be utilized for other mixed ionic electronic conductor systems including memristors and electroresistors, as well as physical systems such as ferroelectric tunneling barriers.
url http://dx.doi.org/10.1063/1.4914943
work_keys_str_mv AT timfarrow subnaspatiallyresolvedconductivityprofilingofsurfaceandinterfacedefectsinceriafilms
AT nanyang subnaspatiallyresolvedconductivityprofilingofsurfaceandinterfacedefectsinceriafilms
AT sandradoria subnaspatiallyresolvedconductivityprofilingofsurfaceandinterfacedefectsinceriafilms
AT alexbelianinov subnaspatiallyresolvedconductivityprofilingofsurfaceandinterfacedefectsinceriafilms
AT stephenjesse subnaspatiallyresolvedconductivityprofilingofsurfaceandinterfacedefectsinceriafilms
AT thomasmarruda subnaspatiallyresolvedconductivityprofilingofsurfaceandinterfacedefectsinceriafilms
AT giuseppebalestrino subnaspatiallyresolvedconductivityprofilingofsurfaceandinterfacedefectsinceriafilms
AT sergeivkalinin subnaspatiallyresolvedconductivityprofilingofsurfaceandinterfacedefectsinceriafilms
AT amitkumar subnaspatiallyresolvedconductivityprofilingofsurfaceandinterfacedefectsinceriafilms
_version_ 1725025626796064768

Similar Items