Behaviour of Thin Film TiO2 Overlaid λ/2 Microstrip Rejection Filter Due to Ageing of the Overlay
The long term behaviour of TiO2 thin film overlaid λ/2 L-section rejection filter due to the ageing of the overlay is reported in this paper. The observations are over a period of upto 600 days with exposure to moisture in between. Due to overlay, existence of double resonance peaks and shifts in re...
Main Authors: | , |
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Format: | Article |
Language: | English |
Published: |
Hindawi Limited
1998-01-01
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Series: | Active and Passive Electronic Components |
Subjects: | |
Online Access: | http://dx.doi.org/10.1155/1998/92903 |
Summary: | The long term behaviour of TiO2 thin film overlaid λ/2 L-section rejection filter due to
the ageing of the overlay is reported in this paper. The observations are over a period of
upto 600 days with exposure to moisture in between. Due to overlay, existence of double
resonance peaks and shifts in resonance due to the various ageing process is observed.
The circuit after 600 days show a considerable shift in the resonance frequency to higher
frequency side and increase in Q. The long term ageing aspects of the dielectric layers
used for protection, passivation and improvement of circuit properties should be taken
into consideration during design and fabrication. |
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ISSN: | 0882-7516 1563-5031 |