Self-assembly of silicon nanowires studied by advanced transmission electron microscopy

Self-assembly of silicon nanowires studied by advanced transmission electron microscopy

Scanning transmission electron microscopy (STEM) was successfully applied to the analysis of silicon nanowires (SiNWs) that were self-assembled during an inductively coupled plasma (ICP) process. The ICP-synthesized SiNWs were found to present a Si–SiO2 core–shell structure and length varying from ≈...

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Bibliographic Details
Main Authors: Marta Agati, Guillaume Amiard, Vincent Le Borgne, Paola Castrucci, Richard Dolbec, Maurizio De Crescenzi, My Alì El Khakani, Simona Boninelli
Format: Article
Language:English
Published: Beilstein-Institut 2017-02-01
Series:Beilstein Journal of Nanotechnology
Subjects:
silicon nanowires
transmission electron microscopy
vapor–liquid–solid growth
Online Access:https://doi.org/10.3762/bjnano.8.47

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