Effects of External Digital Elevation Model Inaccuracy on StaMPS-PS Processing: A Case Study in Shenzhen, China

• Main Authors: Yanan Du, Guangcai Feng, Zhiwei Li, Xing Peng, Jianjun Zhu, Zhengyong Ren
• Format: Article
• Language: English
• Published: MDPI AG 2017-11-01
• Series: Remote Sensing
• Subjects: StaMPS-PS; External DEM; PS-InSAR; PS density and distribution
• Online Access: https://www.mdpi.com/2072-4292/9/11/1115

External Digital Elevation Models (DEMs) with different resolutions and accuracies cause different topographic residuals in differential interferograms of Multi-temporal InSAR (MTInSAR), especially for the phase-based StaMPS-PS. The PS selection and deformation parameter estimation of StaMPS-PS are closely related to the spatially uncorrected error, which is directly affected by external DEMs. However, it is still far from clear how the high resolution and accurate external DEM affects the results of the StaMPS-PS (e.g., PS selection and deformation parameter calculation) on different platforms (X band TerraSAR, C band ENVISAT ASAR and L band ALOS/PALSAR1). In this study, abundant synthetic tests are performed to assess the influences of external DEMs on parameter estimations, such as the mean deformation rate and the deformation time-series. Real SAR images, covering Shenzhen city in China, are also selected to analyze the PS selection and distribution as well as to validate the results of synthetic tests. The results show that the PS points selected by the 5 m TanDEM-X DEM are 10.32%, 4.25% and 0.34% more than those selected by the 30 m SRTM DEM at X, C and L bands SAR platforms, respectively, when a multi-look geocoding operation is adopted for X band in the SRTM DEM case. We also find that the influences of external DEMs on the mean deformation rate are not significant and are inversely proportional to the wavelength of the satellite platforms. The standard deviations of the mean deformation rate difference for the X, C and L bands are 0.54, 0.30 and 0.10 mm/year, respectively. Similarly, the influences of external DEMs on the deformation time-series estimation for the three platforms are also slight, except for local artifacts whose root-mean-square error (RMSE) ≥ 6 mm. Based on these analyses, some implications and suggestions for external DEMs on StaMPS-PS processing are discussed and provided.