Frequency-to-Time-Assisted Interferometry for Full-Field Optical Waveform Measurements With Picosecond Resolution and Microsecond Record Lengths

Frequency-to-Time-Assisted Interferometry for Full-Field Optical Waveform Measurements With Picosecond Resolution and Microsecond Record Lengths

This paper describes and demonstrates a single-shot, full-field (amplitude and phase) optical waveform measurement technique that utilizes interferometry, frequency-to-time mapping, and four-quadrature coherent detection. This generalized frequency-to-time-mapping technique and associated reconstruc...

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Bibliographic Details
Main Authors: Ryan P. Scott, Nicolas K. Fontaine, David J. Geisler, S. J. B. Yoo
Format: Article
Language:English
Published: IEEE 2012-01-01
Series:IEEE Photonics Journal
Subjects:
Ultrafast measurements
fiber gratings
coherent communication
Online Access:https://ieeexplore.ieee.org/document/6187669/

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