Method for assessing atomic sources of flicker noise in superconducting qubits

Abstract Flicker noise causes decoherence in Josephson junction-based superconducting qubits, thus limiting their practical potential as building blocks for quantum computers. This is due to limited length and complexity of executable algorithms, and increased dependency on error-correcting measures...

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Main Authors: Almog Reshef, Maytal Caspary Toroker
Format: Article
Language:English
Published: Nature Publishing Group 2021-10-01
Series:npj Computational Materials
Online Access:https://doi.org/10.1038/s41524-021-00622-5
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spelling doaj-03706977296541c7b15b8bbc27da347f2021-10-10T11:18:04ZengNature Publishing Groupnpj Computational Materials2057-39602021-10-01711610.1038/s41524-021-00622-5Method for assessing atomic sources of flicker noise in superconducting qubitsAlmog Reshef0Maytal Caspary Toroker1Department of Materials Science and Engineering, Technion – Israel Institute of TechnologyDepartment of Materials Science and Engineering, Technion – Israel Institute of TechnologyAbstract Flicker noise causes decoherence in Josephson junction-based superconducting qubits, thus limiting their practical potential as building blocks for quantum computers. This is due to limited length and complexity of executable algorithms, and increased dependency on error-correcting measures. Therefore, identifying and subsiding the atomic sources of flicker noise are of great importance to the development of this technology. We developed a method that combines ab initio DFT calculations and quantum dynamics to model charge transport across a Josephson junction, by which it is possible to more accurately assess different defects as sources of flicker noise. We demonstrate the use of our method in an investigation of various atomic defects, including vacancies, trapping, and substitutions, in an Al|Al2O3|Al Josephson junction. This demonstration both reveals weaknesses in previous attempts to pinpoint the atomic sources of flicker noise and highlights new candidates.https://doi.org/10.1038/s41524-021-00622-5
collection DOAJ
language English
format Article
sources DOAJ
author Almog Reshef
Maytal Caspary Toroker
spellingShingle Almog Reshef
Maytal Caspary Toroker
Method for assessing atomic sources of flicker noise in superconducting qubits
npj Computational Materials
author_facet Almog Reshef
Maytal Caspary Toroker
author_sort Almog Reshef
title Method for assessing atomic sources of flicker noise in superconducting qubits
title_short Method for assessing atomic sources of flicker noise in superconducting qubits
title_full Method for assessing atomic sources of flicker noise in superconducting qubits
title_fullStr Method for assessing atomic sources of flicker noise in superconducting qubits
title_full_unstemmed Method for assessing atomic sources of flicker noise in superconducting qubits
title_sort method for assessing atomic sources of flicker noise in superconducting qubits
publisher Nature Publishing Group
series npj Computational Materials
issn 2057-3960
publishDate 2021-10-01
description Abstract Flicker noise causes decoherence in Josephson junction-based superconducting qubits, thus limiting their practical potential as building blocks for quantum computers. This is due to limited length and complexity of executable algorithms, and increased dependency on error-correcting measures. Therefore, identifying and subsiding the atomic sources of flicker noise are of great importance to the development of this technology. We developed a method that combines ab initio DFT calculations and quantum dynamics to model charge transport across a Josephson junction, by which it is possible to more accurately assess different defects as sources of flicker noise. We demonstrate the use of our method in an investigation of various atomic defects, including vacancies, trapping, and substitutions, in an Al|Al2O3|Al Josephson junction. This demonstration both reveals weaknesses in previous attempts to pinpoint the atomic sources of flicker noise and highlights new candidates.
url https://doi.org/10.1038/s41524-021-00622-5
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