A TESSELLATION MODEL FOR CRACK PATTERNS ON SURFACES

This paper presents a model of random tessellations that reflect several features of crack pattern. There are already several theoretical results derivedwhich indicate that thismodel can be an appropriate referencemodel. Some potential applications are presented in a tentative statistical study.

Bibliographic Details
Main Authors: Werner Nagel, Joseph Mecke, Joachim Ohser, Viola Weiss
Format: Article
Language:English
Published: Slovenian Society for Stereology and Quantitative Image Analysis 2011-05-01
Series:Image Analysis and Stereology
Subjects:
Online Access:http://www.ias-iss.org/ojs/IAS/article/view/832
Description
Summary:This paper presents a model of random tessellations that reflect several features of crack pattern. There are already several theoretical results derivedwhich indicate that thismodel can be an appropriate referencemodel. Some potential applications are presented in a tentative statistical study.
ISSN:1580-3139
1854-5165