A Big Data Architecture for Fault Prognostics of Electronic Devices: Application to Power MOSFETs

A Big Data Architecture for Fault Prognostics of Electronic Devices: Application to Power MOSFETs

This paper deals with the problem faced performing prognostics of electronic devices using a data-driven approach to generate degradation models for predicting their remaining useful life. To be able to generate good models, a lot of experimental data are required. Moreover, the high frequency sampl...

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Bibliographic Details
Main Authors: Carlos J. Alonso-Gonzalez, Belarmino Pulido, Mario Carton, Anibal Bregon
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Accelerated aging
Big Data applications
degradation
power MOSFET
prognostics and health management
remaining life assessment
Online Access:https://ieeexplore.ieee.org/document/8764332/

Internet

https://ieeexplore.ieee.org/document/8764332/

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