Review of near-field optics and superlenses for sub-diffraction-limited nano-imaging

Near-field optics and superlenses for imaging beyond Abbe’s diffraction limit are reviewed. A comprehensive and contemporary background is given on scanning near-field microscopy and superlensing. Attention is brought to recent research leveraging scanning near-field optical microscopy with superlen...

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Bibliographic Details
Main Authors: Wyatt Adams, Mehdi Sadatgol, Durdu Ö. Güney
Format: Article
Language:English
Published: AIP Publishing LLC 2016-10-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/1.4964498
Description
Summary:Near-field optics and superlenses for imaging beyond Abbe’s diffraction limit are reviewed. A comprehensive and contemporary background is given on scanning near-field microscopy and superlensing. Attention is brought to recent research leveraging scanning near-field optical microscopy with superlenses for new nano-imaging capabilities. Future research directions are explored for realizing the goal of low-cost and high-performance sub-diffraction-limited imaging systems.
ISSN:2158-3226