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  1. 1
    Characterization of hot-electron and radiation hardnesses in metal-oxide-semiconductor capacitors and field-effect transistors
    by ZHANG, LIAO-GUI-SHU, 張廖貴術
    Published 1992
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  2. 2
    PtSi/P N淺接面接觸電阻之研究
    by ZHANG LIAO, GUI-SHU, 張廖貴術
    Published 1989
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