RTN and Annealing Related to Stress and Temperature in FIND RRAM Array

by Chih Yuan Chen, Chrong Jung Lin, Ya-Chin King
Published 2019-01-01

Reset Variability in Backfilled Resistive Random Access Memory and Its Correlation to Low Frequency Noise in Read

by Yun-Feng Kao, Chrong Jung Lin, Ya-Chin King
Published 2020-01-01

Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes

by Chi Su, Yi-Pei Tsai, Chrong-Jung Lin, Ya-Chin King
Published 2020-05-01

Correction to: Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes

by Yi-Pei Tsai, Ting-Huan Hsieh, Chrong Jung Lin, Ya-Chin King
Published 2017-11-01

A Study of the Variability in Contact Resistive Random Access Memory by Stochastic Vacancy Model

by Yun-Feng Kao, Wei Cheng Zhuang, Chrong-Jung Lin, Ya-Chin King
Published 2018-07-01

Charge Splitting In Situ Recorder (CSIR) for Real-Time Examination of Plasma Charging Effect in FinFET BEOL Processes

by Yi-Pei Tsai, Ting-Huan Hsieh, Chrong Jung Lin, Ya-Chin King
Published 2017-09-01

Self-Clamping Programming in Narrow-Bridge Floating Gate Cells for Multi-Level Logic Non-Volatile Memory Applications

by Wei-Cheng Zhuang, Ching-Ting Chien, Chrong Jung Lin, Ya-Chin King
Published 2020-01-01

Plasma Charging Effect on the Reliability of Copper BEOL Structures in Advanced FinFET Technologies

by Yi-Pei Tsai, Peng-Chun Liou, Chrong Jung Lin, Ya-Chin King
Published 2018-01-01

An Early Detection Circuit for Endurance Enhancement of Backfilled Contact Resistive Random Access Memory Array

by Yun-Feng Kao, Jiaw-Ren Shih, Chrong Jung Lin, Ya-Chin King
Published 2021-07-01

Wide range detector of plasma induced charging effect for advanced CMOS BEOL processes

by Yi-Jie Chao, Kai-Wei Yang, Chi Su, Chrong-Jung Lin, Ya-Chin King
Published 2021-07-01

A RRAM Integrated 4T SRAM with Self-Inhibit Resistive Switching Load by Pure CMOS Logic Process

by Meng-Yin Hsu, Chu-Feng Liao, Yi-Hong Shih, Chrong Jung Lin, Ya-Chin King
Published 2017-06-01

On-Chip Recovery Operation for Self-Aligned Nitride Logic Non-Volatile Memory Cells in High-K Metal Gate CMOS Technology

by Po-Yen Lin, Yu-Lun Chiu, Yuh-Te Sung, Jim Chen, Tzong-Sheng Chang, Ya-Chin King, Chrong Jung Lin
Published 2015-01-01

Detectors Array for In Situ Electron Beam Imaging by 16-nm FinFET CMOS Technology

by Chien-Ping Wang, Burn Jeng Lin, Jiaw-Ren Shih, Yue-Der Chih, Jonathan Chang, Chrong Jung Lin, Ya-Chin King
Published 2021-05-01

Self-Rectifying Twin-Bit RRAM in 3-D Interweaved Cross-Point Array

by Shu-En Chen, Yung-Wen Chin, Min-Che Hsieh, Chu-Feng Liao, Tzong-Sheng Chang, Chrong-Jung Lin, Ya-Chin King
Published 2015-01-01

Dynamic pH Sensor with Embedded Calibration Scheme by Advanced CMOS FinFET Technology

by Chien-Ping Wang, Ying-Chun Shen, Peng-Chun Liou, Yu-Lun Chueh, Yue-Der Chih, Jonathan Chang, Chrong-Jung Lin, Ya-Chin King
Published 2019-04-01

Via Diode in Cu Backend Process for 3D Cross-Point RRAM Arrays

by Yu-Cheng Liao, Hsin-Wei Pan, Min-Che Hsieh, Tzong-Sheng Chang, Yu-Der Chih, Ming-Jinn Tsai, Chrong Jung Lin, Ya-Chin King
Published 2014-01-01

Retention Model of TaO/HfO x and TaO/AlO x RRAM with Self-Rectifying Switch Characteristics

by Yu-De Lin, Pang-Shiu Chen, Heng-Yuan Lee, Yu-Sheng Chen, Sk. Ziaur Rahaman, Kan-Hsueh Tsai, Chien-Hua Hsu, Wei-Su Chen, Pei-Hua Wang, Ya-Chin King, Chrong Jung Lin
Published 2017-06-01

Reliability Modeling of Ultra-thin Gate Oxide Device for Circuit Functionality Evaluation

by Long - J Du, 杜隆杰
Published 2002

A Novel CMOS Photon Sensing Device With Dark Current Cancellation and Dynamic Sensitivity

by Hsiu-Yu Cheng, 鄭秀渝
Published 2002

Study on Photoresponse in 4-T Photodiode-type CMOS Imager

by Sing-Rong , Li, 李幸茸
Published 2002