Localization and Imaging of Integrated Circuit Defect Using Simple Optical Feedback Detection

by Vernon Julius Cemine, Bernardino Buenaobra, Carlo Mar Blanca, Caesar Saloma
Published 2004-12-01

High-Resolution Differential Thermography of Semiconductor Edifices

by Vera Marie Sastine, Vernon Julius Cemine, Carlo Mar Blanca, Caesar Saloma
Published 2004-12-01