New treatment option for partial-onset seizures: efficacy and safety of lacosamide

by Steve S. Chung
Published 2010-03-01

A review of the efficacy and safety of extended-release topiramate in the adjunctive treatment for refractory partial-onset seizures

by Steve S. Chung
Published 2015-05-01

Cognitive effects of lamotrigine versus topiramate as adjunctive therapy in older adults with epilepsy

by Steve S. Chung, Susan Kerls, Ann Hammer, Robert Kustra
Published 2009-07-01

Spontaneous, unriitting gross hematuria occurring one week after laparoscopic donor nephrectomy

by Steve Y. Chung, Chris H. Chon, Christopher S. Ng, Gerhard J. Fuchs
Published 2004-10-01

Cardiac Murmur Prompting Diagnosis of Metastatic Nonseminomatous Germ Cell Testicular Neoplasia in an 18-Year-Old Patient

by Steve Y. Chung, Benjamin Davies, Sheldon Bastacky, Dilip Gupta, Charles R. Pound
Published 2005-01-01

Preparation and Thermomechanical Properties of Ketone Mesogenic Liquid Crystalline Epoxy Resin Composites with Functionalized Boron Nitride

by Yi-Sheng Lin, Steve Lien-Chung Hsu, Tsung-Han Ho, Li-Cheng Jheng, Yu-Hsiang Hsiao
Published 2020-08-01

An Experimental Approach to Characterizing the Channel Local Temperature Induced by Self-Heating Effect in FinFET

by E Ray Hsieh, Meng-Ru Jiang, Jian-Li Lin, Steve S. Chung, Tse Pu Chen, Shih An Huang, Tai-Ju Chen, Osbert Cheng
Published 2018-01-01

Dimethylimidazolium-Functionalized Polybenzimidazole and Its Organic–Inorganic Hybrid Membranes for Anion Exchange Membrane Fuel Cells

by Li-Cheng Jheng, Cheng-Wei Cheng, Ko-Shan Ho, Steve Lien-Chung Hsu, Chung-Yen Hsu, Bi-Yun Lin, Tsung-Han Ho
Published 2021-08-01

Low Leakage Charge Pumping Measurement Techniques for Advanced CMOS with Gate Oxide in the 1nm Range

by Feng Hsin Jung, 馮信榮
Published 2004

Understanding of the Hot Carrier and NBTI Effects for Advanced CMOS Devices with SiON and N/O stack

by Zi-Qiang Ku, 顧子強
Published 2004

The Investigation of Gate Oxide Interface and Process-Induced Device Reliability in Deep-Submicron and Nanometer CMOS Devices

by Shang-Jr Chen, 陳尚志
Published 2002

Performance and Reliability Improvement of Flash EEPROM with Pocket-Implanted Drain Structure

by Lin Hsin-Fu, 林新富
Published 2002

The Simulation and Modeling of Submicron MOS Devices with LOCOS Gate Structure

by Chang, Chien-Hwa, 張儉華
Published 1992

Investigation of the Mechanism and Reliability in a Two-Bit SONOS Flash Memory

by Jian-Hung Kuo, 郭建鴻
Published 2008

RF CMOS Substrate Modeling in Spice

by Shiuyi Lin, 林旭益
Published 2002

Hot Carrier and NBTI Reliability Evaluation of Dual-Gate CMOS Devices Using an Improved Gated-Diode Measurement Technique

by Da-Kang Lo, 羅大剛
Published 2002

Reliability Studies of Flash Memories with Substrate Bias Enhanced Hot Electron Injection Scheme

by Sze-Jua Luo, 羅思覺
Published 2000

Study of the Data Retention Characteristics in N-Channel Flash EEPROM with Different Floating Gate Materials

by Bo-chang Wu, 吳柏璋
Published 2000

Charge Pumping Technique for the Evaluation of Plasma Induced Edge Damage in Shallow S/D Extension

by Hsuan-ling Kao, 高瑄苓
Published 2000

The Observation of Gate Current Instability in High-k Gate Dielectric MOSFET by a New Gate Current Random Telegraph Noise Approach

by Chia-Ming Chang, 張家銘
Published 2008