Solid phase recrystallization induced by multi-pulse nanosecond laser annealing

by Pablo Acosta Alba, Joris Aubin, Sylvain Perrot, Fulvio Mazzamuto, Adeline Grenier, Sébastien Kerdilès
Published 2021-03-01

A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si1−xGex and Si layers

by Richard Daubriac, Emmanuel Scheid, Hiba Rizk, Richard Monflier, Sylvain Joblot, Rémi Beneyton, Pablo Acosta Alba, Sébastien Kerdilès, Filadelfo Cristiano
Published 2018-07-01

A Versatile Silicon-Silicon Nitride Photonics Platform for Enhanced Functionalities and Applications

by Quentin Wilmart, Houssein El Dirani, Nicola Tyler, Daivid Fowler, Stéphane Malhouitre, Stéphanie Garcia, Marco Casale, Sébastien Kerdiles, Karim Hassan, Christelle Monat, Xavier Letartre, Ayman Kamel, Minhao Pu, Kresten Yvind, Leif Katsuo Oxenløwe, Wilfried Rabaud, Corrado Sciancalepore, Bertrand Szelag, Ségolène Olivier
Published 2019-01-01