Face Recognition on a Smart Image Sensor Using Local Gradients

by Wladimir Valenzuela, Javier E. Soto, Payman Zarkesh-Ha, Miguel Figueroa
Published 2021-04-01

Application of High-Frequency Leakage Current Model for Characterizing Failure Modes in Digital Logic Gates

by Zahra Abedi, Sameer Hemmady, Thomas Antonsen, Edl Schamiloglu, Payman Zarkesh-Ha
Published 2021-05-01