Capabilities of X-ray diffuse scattering method for study of microdefects in semiconductor crystals

by Vladimir T. Bublik, Marina I. Voronova, Kirill D. Shcherbachev
Published 2018-12-01

Regularities of microdefect formation in silicon during heat treatment for internal getter synthesis

by Vladimir T. Bublik, Marina I. Voronova, Kirill D. Shcherbachev, Mikhail V. Mezhennyi, Vladimir Ya. Reznik
Published 2019-09-01

DISTRIBUTION OF DISLOCATIONS IN AlN CRYSTALS GROWN ON EVAPORATING SiC SUBSTRATES

by Tatiana S. Argunova, Mikhail Yu. Gutkin, Kirill D. Shcherbachev, Olga P. Kazarova, Evgeniy N. Mokhov, Jung Ho Je
Published 2016-11-01

Structural properties of the formation of zinc-containing nanoparticles obtained by ion implantation in Si (001) and subsequent thermal annealing

by Ksenia B. Eidelman, Nataliya Yu. Tabachkova, Kirill D. Shcherbachev, Yuri N. Parkhomenko, Vladimir V. Privesentsev, Denis M. Migunov
Published 2017-09-01

Distribution of Dislocations near the Interface in AlN Crystals Grown on Evaporated SiC Substrates

by Tatiana S. Argunova, Mikhail Yu. Gutkin, Jung Ho Je, Alexander E. Kalmykov, Olga P. Kazarova, Evgeniy N. Mokhov, Kristina N. Mikaelyan, Alexander V. Myasoedov, Lev M. Sorokin, Kirill D. Shcherbachev
Published 2017-06-01