The role of convolutional neural networks in scanning probe microscopy: a review

by Ido Azuri, Irit Rosenhek-Goldian, Neta Regev-Rudzki, Georg Fantner, Sidney R. Cohen
Published 2021-08-01

Focused electron beam induced deposition: A perspective

by Michael Huth, Fabrizio Porrati, Christian Schwalb, Marcel Winhold, Roland Sachser, Maja Dukic, Jonathan Adams, Georg Fantner
Published 2012-08-01