Control of the nanosized defect network in superconducting thin films by target grain size

by Moe Moe Aye, Elmeri Rivasto, Mukarram Zaman Khan, Hannes Rijckaert, Esko Salojärvi, Christopher Haalisto, Ermei Mäkilä, Heikki Palonen, Hannu Huhtinen, Isabel Van Driessche, Petriina Paturi
Published 2021-03-01