Emissivity measurement based on deep learning and surface roughness

by Xin Wu, Xiaolong Wei, Haojun Xu, Weifeng He, Yiwen Li, Binbin Pei, Caizhi Li, Xinmin Han
Published 2021-08-01

CompoNet with SFEL: A convolutional neural network for identifying low-emissivity coating damage

by Xin Wu, Haojun Xu, Xiaolong Wei, Yiwen Li, Binbin Pei, Caizhi Li, Weizhuo Hua, Weifeng He
Published 2021-05-01