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廖竟淇
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廖竟淇
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廖竟淇
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1
Investigations of Gate Induced Drain Leakage (GIDL) and Bias Temperature Instability (BTI) on LTPS TFTs and Hf-based High-k CMOSFETs
by
Jing-chyi Liao
,
廖
竟
淇
Published 2008
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2
The Study of Ultra-Thin Oxide Behavior under Nano-Scaled Stress by Conductive Atomic Force Microscopy
by
Jin-Chyi Liao
,
廖
竟
淇
Published 2005
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