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嚴進嶸
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嚴進嶸
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嚴進嶸
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1
Mechanism of Hot Carrier-Reliability in High Voltage P-type LDMOS Transistors
by
Chin-Rung Yan
,
嚴
進
嶸
Published 2007
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2
Reliability Studies of Advanced NAND Flash Cells and Periphery Devices
by
Chin-RungYan
,
嚴
進
嶸
Published 2013
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