Showing 1 - 2 results of 2 for search '卓煜盛', query time: 0.04s Refine Results
  1. 1
    The Electrical Characterization and Reliability Study of Metal-Ta2O5-Silicon Capacitors for Very Large Scale Integrated (VLSI) MOS Gate Oxide Applications
    by Yu-Sheng Cho, 卓煜盛
    Published 1999
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  2. 2
    A Novel Highly Reliable Flash Memory --- Characteristics, Reliability Evaluations, and Applications
    by Caleb Yu-Sheng Cho, 卓煜盛
    Published 2004
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