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Seyfried, V.
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Seyfried, V.
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Characterization of the dynamics of encapsulated silicon MEMS devices using low-coherence heterodyne LDV technology
by
Giesen, M.
,
Heilig, M.
,
Seyfried
,
V
.
,
Winter, M.
,
Wolfer, M.
Published 2023
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Related Subjects
Classifiers
Doppler effect
Encapsulated MEMS
Encapsulated micro-electro-mechanical system
Heterodyne laser Doppler vibrometer
Heterodyning
IR laser Doppler vibrometry
IR laser dopple vibrometry
IR lasers
Interferometry
Laser Doppler Vibrometry
Laser Doppler velocimeters
Laser Doppler vibrometers
Laser vibrometers
Low-coherence
Low-coherent light
Low-coherent lights
MEMS
MEMS (microelectromechanical system)
Refractive index
Silicon
Vibration analysis
Vibration measurement
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