High brightness ultrafast transmission electron microscope based on a laser-driven cold-field emission source: principle and applications

by G. M. Caruso, F. Houdellier, S. Weber, M. Kociak, A. Arbouet
Published 2019-01-01

Mechanics of silicon nitride thin-film stressors on a transistor-like geometry

by S. Reboh, P. Morin, M. J. Hÿtch, F. Houdellier, A. Claverie
Published 2013-10-01

Nanoscale measurements of phosphorous-induced lattice expansion in nanosecond laser annealed germanium

by S. Boninelli, R. Milazzo, R. Carles, F. Houdellier, R. Duffy, K. Huet, A. La Magna, E. Napolitani, F. Cristiano
Published 2018-05-01